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"Knowledge-based linguistic equations for defect detection through ..."

Sébastien Gebus, Esko Juuso, Kauko Leiviskä (2009)

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DOI: 10.1016/J.ESWA.2007.09.059

access: closed

type: Journal Article

metadata version: 2018-11-30

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  - https://dblp.org/rec/journals/eswa/GebusJL09
Sébastien Gebus, Esko Juuso, Kauko Leiviskä:
Knowledge-based linguistic equations for defect detection through functional testing of printed circuit boards. Expert Syst. Appl. 36(1): 292-302 (2009)

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