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"Blackbox Polynomial Identity Testing for Depth 3 Circuits."

Neeraj Kayal, Shubhangi Saraf (2009)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-09-27

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  - electronic edition @ weizmann.ac.il (open access)
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  dblp key:
  - journals/eccc/KayalS09
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  - https://dblp.org/rec/journals/eccc/KayalS09
Neeraj Kayal, Shubhangi Saraf:
Blackbox Polynomial Identity Testing for Depth 3 Circuits. Electron. Colloquium Comput. Complex. TR09 (2009)

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