default search action

combined dblp search
author search
venue search
publication search

ask others

"Replacing Error Vector Magnitude Test with RF and Analog BISTs."

Dallas Webster, Rick Hudgens, Donald Y. C. Lie (2011)

> Home

Details and statistics

DOI: 10.1109/MDT.2011.1

access: closed

type: Journal Article

metadata version: 2020-05-17

- view
  authority control:
- export record
  dblp key:
  - journals/dt/WebsterHL11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/WebsterHL11
Dallas Webster, Rick Hudgens, Donald Y. C. Lie:
Replacing Error Vector Magnitude Test with RF and Analog BISTs. IEEE Des. Test Comput. 28(6): 66-75 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.