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"Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing."

Xiaoqiang Liu et al. (2019)

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DOI: 10.1109/ACCESS.2019.2910845

access: open

type: Journal Article

metadata version: 2019-05-31

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  - https://dblp.org/rec/journals/access/LiuCLYCL19
Xiaoqiang Liu, Li Cai, Baojun Liu, Xiaokuo Yang, Huanqing Cui, Cheng Li:
Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing. IEEE Access 7: 51276-51283 (2019)

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