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"Electromagnetic Interference Caused by Parasitic Electric-line Current on ..."

Jaeyul Choo et al. (2019)

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DOI: 10.1109/ACCESS.2019.2914126

access: open

type: Journal Article

metadata version: 2023-08-28

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  - https://dblp.org/rec/journals/access/ChooPCK19
Jaeyul Choo, Jong-Eon Park, Hosung Choo, Yong-Hwa Kim:
Electromagnetic Interference Caused by Parasitic Electric-line Current on a Digital Module in a Closed Cabinet. IEEE Access 7: 59806-59812 (2019)

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