default search action

combined dblp search
author search
venue search
publication search

ask others

"Testability Analysis and Improvements of Register-Transfer Level Digital ..."

Josef Strnadel (2006)

> Home

Details and statistics

DOI: —

access: open

type: Journal Article

metadata version: 2022-02-14

- view
  - electronic edition @ cai.sk (open access)
- export record
  dblp key:
  - journals/cai/Strnadel06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cai/Strnadel06
Josef Strnadel:
Testability Analysis and Improvements of Register-Transfer Level Digital Circuits. Comput. Artif. Intell. 25(5): 441-464 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.