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"Meta Pattern Concern Score: A Novel Metric for Customizable Evaluation of ..."

Yanyun Wang, Dehui Du, Yuanhao Liu (2022)

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DOI: 10.48550/ARXIV.2209.06408

access: open

type: Informal or Other Publication

metadata version: 2023-05-23

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  dblp key:
  - journals/corr/abs-2209-06408
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  - https://dblp.org/rec/journals/corr/abs-2209-06408
Yanyun Wang, Dehui Du, Yuanhao Liu:
Meta Pattern Concern Score: A Novel Metric for Customizable Evaluation of Multi-classification. CoRR abs/2209.06408 (2022)

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