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"Data set for paper "Reliability of Low-Temperature Fully Photolithographic ..."

Guangyu Yao (2019)

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DOI: 10.21227/0CBC-5B56

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type: Data or Artifact

metadata version: 2024-06-18

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Guangyu Yao:
Data set for paper "Reliability of Low-Temperature Fully Photolithographic In-Si-O Thin-Film Transistors". IEEE DataPort, 2019

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