default search action

combined dblp search
author search
venue search
publication search

ask others

"A Model Parameter Extraction Methodology Including Time-Dependent ..."

Javier Diaz-Fortuny et al. (2018)

> Home

Details and statistics

DOI: 10.1109/SMACD.2018.8434867

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/smacd/Diaz-FortunySTC18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/smacd/Diaz-FortunySTC18
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Antonio Toro-Frías, Rafael Castro-López, Javier Martín-Martínez, Elisenda Roca, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría:
A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation. SMACD 2018: 53-56

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.