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"Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics."

Stewart E. Rauch et al. (2020)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-19

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  - electronic edition @ ieee.org
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  dblp key:
  - conf/ofc/RauchLVJM30
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  persistent URL:
  - https://dblp.org/rec/conf/ofc/RauchLVJM30
Stewart E. Rauch, Dongho Lee, Alexey Vert, Lin Jiang, Byoung Min:
Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics. OFC 2020: 1-3

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