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"Optical and Electrical Testing of Latchup in I/O Interface Circuits."

Franco Stellari et al. (2003)

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DOI: 10.1109/TEST.2003.1270845

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-06

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  - conf/itc/StellariSMGWCMS03
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  persistent URL:
  - https://dblp.org/rec/conf/itc/StellariSMGWCMS03
Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245

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