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"Studying the Impact of Temperature Gradient on Electromigration Lifetime ..."

Yong Hyeon Yi et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117811

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/YiKZKS23
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  - https://dblp.org/rec/conf/irps/YiKZKS23
Yong Hyeon Yi, Chris H. Kim, Chen Zhou, Armen Kteyan, Valeriy Sukharev:
Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. IRPS 2023: 1-5

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