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"Utilizing Transformer Deep Learning Based Outlier Detection to Screen Out ..."

C. W. Lin et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529397

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  - conf/irps/LinTYSHCCTKLCHLLL24
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  - https://dblp.org/rec/conf/irps/LinTYSHCCTKLCHLLL24
C. W. Lin, P. C. Tsao, Y. L. Yang, C. C. Sun, C. C. Huang, C. W. Chen, C. K. Chang, Y. J. Ting, K. Koh, Ross Lee, W. C. Chen, Y. S. Huang, M. Z. Lee, C. T. Lai, T. H. Lee:
Utilizing Transformer Deep Learning Based Outlier Detection to Screen Out Reliability Weak ICs. IRPS 2024: 1-5

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