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"Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells."

Melanie Brocard et al. (2017)

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DOI: 10.1109/ISVLSI.2017.100

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/isvlsi/BrocardMCSFLCBB17
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  persistent URL:
  - https://dblp.org/rec/conf/isvlsi/BrocardMCSFLCBB17
Melanie Brocard, Benoît Mathieu, Jean-Philippe Colonna, Cristiano Santos, Claire Fenouillet-Béranger, Cao-Minh Vincent Lu, Gerald Cibrario, Laurent Brunet, Perrine Batude, François Andrieu, Sébastien Thuries, Olivier Billoint:
Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells. ISVLSI 2017: 539-544

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