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"Physically-Based Simulation of Electromigration Induced Failures in Copper ..."

Valeriy Sukharev (2004)

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DOI: 10.1109/ISQED.2004.1283677

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/isqed/Sukharev04
Valeriy Sukharev:
Physically-Based Simulation of Electromigration Induced Failures in Copper Dual-Damascene Interconnect. ISQED 2004: 225-231

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