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"Defect-related knowledge acquisition for decision support systems in ..."

Sébastien Gebus, Kauko Leiviskä (2007)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2007-07-11

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  dblp key:
  - conf/icinco/GebusL07
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  - https://dblp.org/rec/conf/icinco/GebusL07
Sébastien Gebus, Kauko Leiviskä:
Defect-related knowledge acquisition for decision support systems in electronics assembly. ICINCO-ICSO 2007: 270-275

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