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"IR-drop based electromigration assessment: parametric failure chip-scale ..."

Valeriy Sukharev et al. (2014)

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DOI: 10.1109/ICCAD.2014.7001387

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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  dblp key:
  - conf/iccad/SukharevHCT14
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  - https://dblp.org/rec/conf/iccad/SukharevHCT14
Valeriy Sukharev, Xin Huang, Hai-Bao Chen, Sheldon X.-D. Tan:
IR-drop based electromigration assessment: parametric failure chip-scale analysis. ICCAD 2014: 428-433

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