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"High performance test generation for accurate defect models in CMOS gate ..."

Hector R. Sucar, Susheel J. Chandra, David J. Wharton (1989)

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DOI: 10.1109/ICCAD.1989.76928

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/iccad/SucarCW89
Hector R. Sucar, Susheel J. Chandra, David J. Wharton:
High performance test generation for accurate defect models in CMOS gate array technology. ICCAD 1989: 166-169

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