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"A selective pattern-compression scheme for power and test-data reduction."

Chia-Yi Lin, Hung-Ming Chen (2007)

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DOI: 10.1109/ICCAD.2007.4397317

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/LinC07a
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/LinC07a
Chia-Yi Lin, Hung-Ming Chen:
A selective pattern-compression scheme for power and test-data reduction. ICCAD 2007: 520-525

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