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"Human Cognitive Reliability and R&D Efficiency: A Human Factor Study ..."

Yuanjun Li et al. (2024)

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DOI: 10.1007/978-3-031-60731-8_16

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-12

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  dblp key:
  - conf/hci/LiZCY24
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Yuanjun Li, Mengya Zhu, Dengkai Chen, Yiting Yu:
Human Cognitive Reliability and R&D Efficiency: A Human Factor Study in Semiconductor Pilot Scale Production Line. HCI (10) 2024: 223-242

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