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"Pattern grading for testing critical paths considering power supply noise ..."

Junxia Ma et al. (2010)

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DOI: 10.1145/1785481.1785512

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Junxia Ma, Jeremy Lee, Mohammad Tehranipoor, Nisar Ahmed, Patrick Girard:
Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric. ACM Great Lakes Symposium on VLSI 2010: 127-130

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