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"Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs."

Joachim Sudbrock et al. (2005)

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DOI: 10.1109/DSD.2005.30

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/dsd/SudbrockRUKP05
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  persistent URL:
  - https://dblp.org/rec/conf/dsd/SudbrockRUKP05
Joachim Sudbrock, Jaan Raik, Raimund Ubar, Wieslaw Kuzmicz, Witold A. Pleskacz:
Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs. DSD 2005: 79-82

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