default search action

combined dblp search
author search
venue search
publication search

ask others

"On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a ..."

Shianling Wu et al. (2008)

> Home

Details and statistics

DOI: 10.1109/DFT.2008.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/dft/WuWJSSWHJLHA08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/WuWJSSWHJLHA08
Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte:
On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.