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"Adaptable Voltage Scan Testing of Charge-Sharing Faults for Domino Circuits."

Ching-Hwa Cheng (2002)

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DOI: 10.1109/DFTVS.2002.1173511

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/Cheng02
Ching-Hwa Cheng:
Adaptable Voltage Scan Testing of Charge-Sharing Faults for Domino Circuits. DFT 2002: 147-158

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