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"Fault Models of CMOS Gates: An Empirical Study Based on Mutation Analysis."

Xiaofeng Tang et al. (2014)

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DOI: 10.1109/DASC.2014.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/dasc/TangXLY14
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  persistent URL:
  - https://dblp.org/rec/conf/dasc/TangXLY14
Xiaofeng Tang, Aiqiang Xu, Wenhai Li, Zhiyong Yang:
Fault Models of CMOS Gates: An Empirical Study Based on Mutation Analysis. DASC 2014: 115-120

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