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"Oberflächenkonturvermessung mikroskopischer Objekte durch Projektion ..."

Torsten Scheuermann et al. (1995)

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DOI: 10.1007/978-3-642-79980-8_38

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-24

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  dblp key:
  - conf/dagm/ScheuermannPEJ95
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  - https://dblp.org/rec/conf/dagm/ScheuermannPEJ95
Torsten Scheuermann, Georg Pfundt, Peter Eyerer, Bernd Jähne:
Oberflächenkonturvermessung mikroskopischer Objekte durch Projektion statisitscher Rauschmuster. DAGM-Symposium 1995: 319-326

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