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"A Study in Coverage-Driven Test Generation."

Mike Benjamin et al. (1999)

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DOI: 10.1145/309847.310108

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/BenjaminGHMSW99
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  - https://dblp.org/rec/conf/dac/BenjaminGHMSW99
Mike Benjamin, Daniel Geist, Alan Hartman, Gérard Mas, Ralph Smeets, Yaron Wolfsthal:
A Study in Coverage-Driven Test Generation. DAC 1999: 970-975

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