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"Self-Supervised Industrial Image Generation for Defect Recognition Under ..."

Younkwan Lee (2024)

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DOI: 10.1109/AVSS61716.2024.10672565

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-12

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Younkwan Lee:
Self-Supervised Industrial Image Generation for Defect Recognition Under Limited Data. AVSS 2024: 1-7

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