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"Multiple Scan Tree Design with Test Vector Modification."

Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy (2004)

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DOI: 10.1109/ATS.2004.61

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy:
Multiple Scan Tree Design with Test Vector Modification. Asian Test Symposium 2004: 76-81

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