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"Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug ..."

Khairul Khusyari et al. (2008)

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DOI: 10.1109/ATS.2008.66

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/KhusyariNJANAO08
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  - https://dblp.org/rec/conf/ats/KhusyariNJANAO08
Khairul Khusyari, Wei Tee Ng, Neal Jaarsma, Robert Abraham, Peng Weng Ng, Boon Hui Ang, Chin Hu Ong:
Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method. ATS 2008: 271

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