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"Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM."

Bing-Chuan Bai et al. (2013)

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DOI: 10.1109/ATS.2013.32

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/BaiHWCCLCL13
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  persistent URL:
  - https://dblp.org/rec/conf/ats/BaiHWCCLCL13
Bing-Chuan Bai, Chun-Lung Hsu, Ming-Hsueh Wu, Chen-An Chen, Yee-Wen Chen, Kun-Lun Luo, Liang-Chia Cheng, James Chien-Mo Li:
Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM. Asian Test Symposium 2013: 123-127

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