default search action

combined dblp search
author search
venue search
publication search

ask others

"Test access mechaism for stack test time reduction of 3-dimensional ..."

Inhyuk Choi, Hyunggoy Oh, Sungho Kang (2016)

> Home

Details and statistics

DOI: 10.1109/APCCAS.2016.7804019

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/apccas/ChoiOK16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/apccas/ChoiOK16
Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. APCCAS 2016: 522-525

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.