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"A dynamic test compaction procedure for high-quality path delay testing."

Masayasu Fukunaga et al. (2006)

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DOI: 10.1109/ASPDAC.2006.1594707

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/aspdac/FukunagaKWMHS06
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  - https://dblp.org/rec/conf/aspdac/FukunagaKWMHS06
Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato:
A dynamic test compaction procedure for high-quality path delay testing. ASP-DAC 2006: 348-353

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