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"Structural Reliability and Performance Analysis of Backside PDN."

Sunghwan Kim et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185330

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-28

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  - conf/vlsit/KimKKAKJLK23
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  - https://dblp.org/rec/conf/vlsit/KimKKAKJLK23
Sunghwan Kim, Geun-Myeong Kim, Seong-Nam Kim, Saetbyeol Ahn, Yoon-Suk Kim, Inkook Jang, Kyoung-Woo Lee, Dae Sin Kim:
Structural Reliability and Performance Analysis of Backside PDN. VLSI Technology and Circuits 2023: 1-2

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