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"Low Shift and Capture Power Scan Tests."

Santiago Remersaro et al. (2007)

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DOI: 10.1109/VLSID.2007.101

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vlsid/RemersaroLRPR07
Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski:
Low Shift and Capture Power Scan Tests. VLSI Design 2007: 793-798

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