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"Automated AC (Timing) Characterization for Digital Circuit Testing."

S. Balajee, Ananta K. Majhi (1998)

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DOI: 10.1109/ICVD.1998.646636

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/BalajeeM98
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/BalajeeM98
S. Balajee, Ananta K. Majhi:
Automated AC (Timing) Characterization for Digital Circuit Testing. VLSI Design 1998: 374-377

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