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"System-level test coverage prediction by structural stress test data mining."

Bing-Yang Lin, Cheng-Wen Wu, Harry H. Chen (2015)

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DOI: 10.1109/VLSI-DAT.2015.7114508

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Bing-Yang Lin, Cheng-Wen Wu, Harry H. Chen:
System-level test coverage prediction by structural stress test data mining. VLSI-DAT 2015: 1-4

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