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"Fault-Based Test Case Generation for Component Connectors."

Bernhard K. Aichernig et al. (2009)

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DOI: 10.1109/TASE.2009.14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/tase/AichernigAAB0R09
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  persistent URL:
  - https://dblp.org/rec/conf/tase/AichernigAAB0R09
Bernhard K. Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Sun Meng, Jan J. M. M. Rutten:
Fault-Based Test Case Generation for Component Connectors. TASE 2009: 147-154

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