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M. Fadlallah
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2010 – 2019
- 2018
- [c9]Fatima Mazeh, Bilal Hammoud
, Hussam Ayad, Fabien Ndagijimana, Ghaleb Faour, Majida Fadlallah, Jalal Jomaah:
Snow Depth Retrieval Algorithm from Radar Backscattering Measurements at L- and X- Band Using Multi-Incidence Angles. HPCS 2018: 43-46 - [c8]Bilal Hammoud
Oil Thickness Estimation Using Single- and Dual- Frequency Maximum-Likelihood Approach. HPCS 2018: 65-68 - 2017
- [c7]Mohammad H. Haroun, Hussam Ayad, Jalal Jomaa, Majida Fadlallah, Kassem Jomaa, Marta Cabedo-Fabrés, Miguel Ferrando-Bataller
Sampled Antenna Array Digital Beamforming for LTE-Advanced. HPCS 2017: 282-287 - [c6]Bilal Hammoud
Multi-Frequency Approach for Oil Spill Remote Sensing Detection. HPCS 2017: 295-299 - 2014
- [c5]Hussam Ayad, A. Khalil, M. Fadlallah, Jalal Jomaah:
Practical design for circularly polarized dual off-center aperture-coupled microstrip antenna for GPS application. HPCS 2014: 816-819 - 2013
- [c4]Hussam Ayad, A. Khalil, H. Youssef, M. Fadlallah, Fabien Ndagijimana, M. Saleh, Jalal Jomaah:
MSRR metamaterial-based antenna system for MIMO applications. ICCIT 2013: 376-380 - [c3]Hussam Ayad, A. Khalil, M. Fadlallah, Fabien Ndagijimana, Jalal Jomaah:
Design of MSRR-loaded dual-band dipole PCB antennas. ICT 2013: 1-5 - 2012
- [c2]Hussam Ayad, M. Fadlallah, H. Youssef, H. Elmokdad, Fabien Ndagijimana, Jalal Jomaah:
Performances of low profile dipole antenna AMC-based surface using metamaterials structures. ICT 2012: 1-5
2000 – 2009
- 2005
- [j4]Christian Petit, A. Meinertzhagen, Damien Zander, O. Simonetti, M. Fadlallah, T. Maurel:
Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectron. Reliab. 45(3-4): 479-485 (2005) - 2003
- [j3]M. Fadlallah, C. Petit, A. Meinertzhagen, Gérard Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader:
Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectron. Reliab. 43(9-11): 1433-1438 (2003) - 2002
- [j2]M. Fadlallah, Gérard Ghibaudo, Jalal Jomaah, M. Zoaeter, G. Guégan:
Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectron. Reliab. 42(1): 41-46 (2002) - 2001
- [j1]M. Fadlallah, Arkadiusz Szewczyk
Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. Microelectron. Reliab. 41(9-10): 1361-1366 (2001) - 2000
- [c1]M. Fadlallah, Gérard Ghibaudo, Jalal Jomaah, M. Zoaeter:
Numerical simulation and modeling of static characteristics and electrical noise in submicron MOS transistors. ICECS 2000: 940-943
Coauthor Index
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