Submicron sensors of local electric field with single-electron resolution at room temperature (Q61611504)

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English	Submicron sensors of local electric field with single-electron resolution at room temperature	No description defined

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instance of

scholarly article

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title

Submicron sensors of local electric field with single-electron resolution at room temperature (English)

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author

Mohamed Missous

object named as

M. Missous

series ordinal

5

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Andre Geim

series ordinal

9

object named as

A. K. Geim

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Konstantin Novoselov

series ordinal

2

object named as

K. S. Novoselov

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Irina Grigorieva

series ordinal

8

object named as

I. V. Grigorieva

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Sergey V. Morozov

series ordinal

3

object named as

S. V. Morozov

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author name string

I. I. Barbolina

series ordinal

1

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S. V. Dubonos

series ordinal

4

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A. O. Volkov

series ordinal

6

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D. A. Christian

series ordinal

7

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language of work or name

English

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publication date

2 January 2006

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published in

Applied Physics Letters

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volume

88

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issue

1

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page(s)

013901

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cites work

Formation of sharp potential minima close to a quantum point contact by impinging alpha particles

1 reference

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COCI

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reference URL

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Measurements of Coulomb blockade with a noninvasive voltage probe

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Scanning noninvasive voltage probe operating at 4.2 K

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Subsurface charge accumulation imaging of a quantum Hall liquid

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https://opencitations.net/index/coci/api/v1/references/10.1063/1.2159564

Electronic detection of DNA by its intrinsic molecular charge

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https://opencitations.net/index/coci/api/v1/references/10.1063/1.2159564

Cell-transistor hybrid systems and their potential applications.

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11 October 2022

reference URL

https://opencitations.net/index/coci/api/v1/references/10.1063/1.2159564

A neuron-silicon junction: a Retzius cell of the leech on an insulated-gate field-effect transistor.

1 reference

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COCI

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11 October 2022

reference URL

https://opencitations.net/index/coci/api/v1/references/10.1063/1.2159564

Submicron probes for Hall magnetometry over the extended temperature range from helium to room temperature

1 reference

stated in

COCI

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11 October 2022

reference URL

https://opencitations.net/index/coci/api/v1/references/10.1063/1.2159564

Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy

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Kelvin probe force microscopy

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reference URL

https://opencitations.net/index/coci/api/v1/references/10.1063/1.2159564

Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges

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High‐resolution capacitance measurement and potentiometry by force microscopy

1 reference

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retrieved

11 October 2022

reference URL

https://opencitations.net/index/coci/api/v1/references/10.1063/1.2159564

Identifiers

DOI

10.1063/1.2159564

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