Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry (Q42909239)
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scientific article published on October 1, 2010
Language | Label | Description | Also known as |
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English | Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry |
scientific article published on October 1, 2010 |
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Effects of cryogenic sample analysis on molecular depth profiles with TOF-secondary ion mass spectrometry (English)
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Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry (English)
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John S. Fletcher
Nicholas Winograd
Jeanette Kordys
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Alan M. Piwowar
Nicholas P. Lockyer
1 October 2010
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