Energy deposition during molecular depth profiling experiments with cluster ion beams (Q36909616)

17 August 2017

Energy deposition during molecular depth profiling experiments with cluster ion beams (English)

1 reference

17 August 2017

Nicholas Winograd

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Joseph Kozole

1 reference

17 August 2017

Andreas Wucher

series ordinal

1 reference

17 August 2017

language of work or name

English

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publication date

13 June 2008

1 reference

17 August 2017

1 reference

17 August 2017

1 reference

17 August 2017

1 reference

17 August 2017

5293-5301

1 reference

The effect of incident angle on the C(60) bombardment of molecular solids.

17 August 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energy

29 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Secondary ion MS imaging to relatively quantify cholesterol in the membranes of individual cells from differentially treated populations

29 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Improvement of biological time-of-flight-secondary ion mass spectrometry imaging with a bismuth cluster ion source

29 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Molecular depth profiling of histamine in ice using a buckminsterfullerene probe.

29 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Performance characteristics of a chemical imaging time-of-flight mass spectrometer

29 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Molecular ion imaging and dynamic secondary ion mass spectrometry of organic compounds

29 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Energy deposition control during cluster bombardment: a molecular dynamics view

29 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

TOF-SIMS 3D biomolecular imaging of Xenopus laevis oocytes using buckminsterfullerene (C60) primary ions

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Mesoscale energy deposition footprint model for kiloelectronvolt cluster bombardment of solids.

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Molecular depth profiling with cluster ion beams.

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Depth profiling of peptide films with TOF-SIMS and a C60 probe

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Mass spectrometric imaging of lipids in brain tissue

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometry

4 September 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2553714

Surface sensitivity in cluster-ion-induced sputtering

4 September 2018

1 reference

12 December 2020

Depth profiling of Langmuir-Blodgett films with a buckminsterfullerene probe

1 reference

12 December 2020

A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

1 reference

12 December 2020

Protocols for three-dimensional molecular imaging using mass spectrometry

1 reference

12 December 2020

Molecular depth-profiling of polycarbonate with low-energy Cs+ ions

1 reference

12 December 2020

Microscopic insights into the sputtering of thin organic films on Ag{111} induced by C60 and Ga bombardment

1 reference

12 December 2020

Identifiers

DOI

10.1021/AC8002962

1 reference

17 August 2017

1 reference

17 August 2017

PubMed publication ID

18549239

1 reference