ToF‐SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profiles (Q35357023)
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scientific article published on January 1, 2011
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | ToF‐SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profiles |
scientific article published on January 1, 2011 |
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ToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth Profiles (English)
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ToF‐SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profiles (English)
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Shin Muramoto
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Jeremy Brison
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David Castner
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1 January 2011
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43
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1-2
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58-61
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