(Q35357023)

7 August 2017

title

ToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth Profiles (English)

1 reference

https://api.crossref.org/works/10.1002/SIA.3479

7 August 2017

ToF‐SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profiles (English)

1 reference

15 December 2024

main subject

alpha,alpha-trehalose

0 references

author name string

Shin Muramoto

series ordinal

1 reference

7 August 2017

Jeremy Brison

series ordinal

1 reference

7 August 2017

David Castner

series ordinal

1 reference

7 August 2017

language of work or name

English

1 reference

National Center for Biotechnology Information

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/esummary.fcgi?db=pubmed&retmode=json&id=22016576

15 December 2024

publication date

1 January 2011

1 reference

7 August 2017

January 2011

1 reference

National Center for Biotechnology Information

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/esummary.fcgi?db=pubmed&retmode=json&id=22016576

full work available at URL

15 December 2024

https://europepmc.org/articles/pmc3194093?pdf=render

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?resulttype=core&format=json&query=SRC%3AMED%20AND%20EXT_ID%3A22016576

https://europepmc.org/articles/PMC3194093

15 December 2024

file format

HyperText Markup Language

online access status

open access

content deliverer

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?resulttype=core&format=json&query=SRC%3AMED%20AND%20EXT_ID%3A22016576

https://europepmc.org/articles/PMC3194093?pdf=render

15 December 2024

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?resulttype=core&format=json&query=SRC%3AMED%20AND%20EXT_ID%3A22016576

https://doi.org/10.1002/sia.3479

15 December 2024

online access status

open access

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?resulttype=core&format=json&query=SRC%3AMED%20AND%20EXT_ID%3A22016576

https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fsia.3479

15 December 2024

1 reference

https://api.crossref.org/works/10.1002/SIA.3479

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.3479/fullpdf

15 December 2024

1 reference

https://api.crossref.org/works/10.1002/SIA.3479

Surface and Interface Analysis

15 December 2024

published in

1 reference

7 August 2017

1 reference

7 August 2017

issue

1-2

1 reference

7 August 2017

page(s)

58-61

1 reference

ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis

7 August 2017

cites work

1 reference

PubMed Central

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3194093

Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energy

12 July 2018

1 reference

PubMed Central

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3194093

Enhancement of sputtering yields due to C60 versus Ga bombardment of Ag[111] as explored by molecular dynamics simulations.

12 July 2018

1 reference

PubMed Central

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3194093

Molecular depth profiling with cluster ion beams.

12 July 2018

1 reference

Crossref

https://api.crossref.org/works/10.1002%2FSIA.3479

Mesoscale energy deposition footprint model for kiloelectronvolt cluster bombardment of solids.

21 January 2018

1 reference

Crossref

https://api.crossref.org/works/10.1002%2FSIA.3479

Molecular depth-profiling of polycarbonate with low-energy Cs+ ions

21 January 2018

1 reference

PubMed

https://pubmed.ncbi.nlm.nih.gov/22016576

inferred from PubMed ID database lookup

12 December 2020

based on heuristic

Microscopic insights into the sputtering of thin organic films on Ag{111} induced by C60 and Ga bombardment

1 reference

PubMed

https://pubmed.ncbi.nlm.nih.gov/22016576

inferred from PubMed ID database lookup

12 December 2020

based on heuristic

Identifiers

DOI

10.1002/SIA.3479

1 reference

7 August 2017

1 reference

7 August 2017

1 reference