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Wikidata

(Q54478818)

English

A switch from high-fidelity to error-prone DNA double-strand break repair underlies stress-induced mutation.

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title
A switch from high-fidelity to error-prone DNA double-strand break repair underlies stress-induced mutation (English)
1 reference
stated in
Europe PubMed Central
PubMed publication ID
16168374
reference URL
https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:16168374%20AND%20SRC:MED&resulttype=core&format=json
retrieved
7 January 2020

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