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"Data-Driven Fault Diagnosis of Internal Short Circuit for Series-Connected ..."

Dongdong Qiao et al. (2024)

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DOI: 10.1109/TII.2024.3353872

access: closed

type: Journal Article

metadata version: 2024-05-07

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  - https://dblp.org/rec/journals/tii/QiaoWJFGLZD24
Dongdong Qiao, Xuezhe Wei, Bo Jiang, Wenjun Fan, Hui Gong, Xin Lai, Yuejiu Zheng, Haifeng Dai:
Data-Driven Fault Diagnosis of Internal Short Circuit for Series-Connected Battery Packs Using Partial Voltage Curves. IEEE Trans. Ind. Informatics 20(4): 6751-6761 (2024)

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