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"Thermal stability of IGBT high-frequency operation."

Kuang Sheng, Stephen J. Finney, Barry W. Williams (2000)

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DOI: 10.1109/41.824018

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - journals/tie/ShengFW00
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  - https://dblp.org/rec/journals/tie/ShengFW00
Kuang Sheng, Stephen J. Finney, Barry W. Williams:
Thermal stability of IGBT high-frequency operation. IEEE Trans. Ind. Electron. 47(1): 9-16 (2000)

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