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"SOC Test Architecture and Method for 3-D ICs."

Chih-Yen Lo et al. (2010)

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DOI: 10.1109/TCAD.2010.2051732

access: closed

type: Journal Article

metadata version: 2023-09-30

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Chih-Yen Lo, Yu-Tsao Hsing, Li-Ming Denq, Cheng-Wen Wu:
SOC Test Architecture and Method for 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(10): 1645-1649 (2010)

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