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"A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in ..."

Wen-Wen Hsieh et al. (2010)

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DOI: 10.1109/TCAD.2009.2035584

access: closed

type: Journal Article

metadata version: 2022-09-09

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  - https://dblp.org/rec/journals/tcad/HsiehCLH10
Wen-Wen Hsieh, Shih-Liang Chen, I-Sheng Lin, TingTing Hwang:
A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in At-Speed Scan Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(2): 289-298 (2010)

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