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"Patent citation indicators: One size fits all?"

Jurriën Bakker et al. (2016)

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DOI: 10.1007/S11192-015-1786-0

access: closed

type: Journal Article

metadata version: 2024-10-06

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  - journals/scientometrics/BakkerVZL16
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  - https://dblp.org/rec/journals/scientometrics/BakkerVZL16
Jurriën Bakker, Dennis Verhoeven, Lin Zhang, Bart Van Looy:
Patent citation indicators: One size fits all? Scientometrics 106(1): 187-211 (2016)

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